Fermi Level Dynamics
Atomic Force Microscopy
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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Hlib Lyshchuk1,2, Alexey V Verkhovtsev3, Juraj Fedor1
1J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Dolejškova 3, 18223 Prague, Czech Republic.
Electron beam irradiation causes iron pentacarbonyl fragmentation, influencing nanofabrication. Fragmentation dynamics are similar across substrates but affected by binding strength and substrate structure.
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