Related Experiment Video
Updated: Jul 10, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Charge transfer tunneling contacts for n-type monolayer semiconductor toward high performance electronics
Pan Chen1, Canfei Gao1, Wenjun Wu1
1Shanghai Key Laboratory of High Temperature Superconductors, Institute for Quantum Science and Technology, Department of Physics, Shanghai University, Shanghai 200444, China.
Researchers developed novel quasi-one-dimensional tunneling contacts for 2D semiconductors. This breakthrough overcomes Schottky barrier height limitations, enabling high-performance 2D electronic devices by using transition metal oxides to engineer contact properties.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Two-dimensional (2D) semiconductors, like transition metal dichalcogenides (TMDs), offer revolutionary potential for electronics.
- Contact engineering challenges, including Fermi-level pinning and metal-induced gap states (MIGS), impede high-performance 2D material devices.
Purpose of the Study:
- To propose a novel strategy for establishing quasi-one-dimensional tunneling contacts in 2D materials.
- To overcome limitations in traditional contact engineering for 2D semiconductor devices.
Main Methods:
- Utilizing high-electron-affinity transition metal oxides (TMOs) to locally modulate the electronic properties of monolayer MoS2.
- Introducing MoO3 to induce charge-transfer anti-doping, creating an insulating tunneling layer.
- Fabricating field-effect transistors with Au/MoO3-contacted monolayer-MoS2.
Main Results:
- Achieved near-ideal ohmic characteristics with an exceptionally low Schottky barrier height (SBH) of 1.6 meV.
- Demonstrated a field-effect mobility of 559.5 cm2/V·s at 10 K.
- Showcased tunability of SBH by substituting MoO3 with V2O5, confirming the strategy's versatility.
Conclusions:
- The proposed tunneling contact strategy effectively overcomes SBH limitations in 2D electronics.
- This approach offers a promising pathway for advancing next-generation high-performance 2D electronic devices.
- The method's versatility allows for tuning contact properties for diverse applications.
More Related Videos
Related Concept Videos
Metal-Semiconductor Junctions
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The semiconductor's...
P-N junction
Biasing of Metal-Semiconductor Junctions
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
Carrier Transport
Drift Current:
The drift of charge carriers is started by an external electric field (E). Charged particles, such as electrons and holes, experience an acceleration between collisions with lattice atoms. For electrons, this results in a drift velocity (vd) given by:
Schottky Barrier Diode
Biasing of FET
In an N-channel JFET, the structure consists of N-type material forming the channel on a P-type substrate, with the gate...

