Robust [Formula: see text]-mapping in composites via joint beam-hardening and detector-response correction

Yuetong Zhao1,2,3, Jie Zhang1,2, Xin Yan1,2

  • 1State Key Laboratory of Ultrafast Optical Science and Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an, 710119, China.

Scientific Reports
|July 8, 2026
PubMed
Summary

This study introduces a new method to correct X-ray imaging distortions, improving quantitative effective atomic number (Zeff) calculations. The technique enhances material discrimination in composite materials for non-destructive testing.

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