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Self-intercalation strategy for enhanced transport in all-MoX2 (X = S, Se) lateral heterostructures: a
Huan Wang1,2, Xiaojie Liu1, Hui Wang1
1Key Laboratory for Photonic and Electronic Bandgap Materials of Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin, 150025, China. wlyht@126.com.
None:
To address the challenge of developing post-Moore-era field-effect transistors, we propose a self-intercalation (si) strategy that converts semiconducting MoX2 (X = S, Se) into a metallic si-MoX2 phase, enabling the construction of all-MoX2 lateral heterojunctions. Using first-principles calculations, we systematically investigate the electronic structure of si-MoX2 and the transport properties of the resulting si-MoX2/MoX2 heterojunctions. The results indicate that band hybridization induced by the intercalated Mo atoms drives the semiconductor-to-metal transition. Among the lateral heterojunctions, si-MoS2/MoS2 exhibits significantly higher conductivity than si-MoSe2/MoSe2, delivering a current density of 1447 µA µm-1 at a bias of 0.7 V and a low contact resistance of 242 Ω µm. Moreover, the heterojunction features a low contact potential difference, which supports low-voltage operation. This design opens a new, all-2D material route toward advanced electronic devices at the sub-3 nm node.
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