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Related Concept Videos

Imaging Biological Samples with Optical Microscopy01:18

Imaging Biological Samples with Optical Microscopy

Optical microscopy uses optic principles to provide detailed images of samples. Antonie van Leeuwenhoek designed the first compound optical microscope in the 17th century to visualize blood cells, bacteria, and yeast cells. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes with enhanced magnification and resolution.
In optical microscopy, the specimen to be viewed is placed on a glass slide and clipped on the stage...
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Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
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Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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Related Experiment Video

Updated: Jul 12, 2026

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks
10:13

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks

Published on: April 28, 2023

High Numerical Aperture Metalens for the Deep Ultraviolet.

Omar A M Abdelraouf1, Chee Leng Lay1, Haoyu Ge1

  • 1Institute of Materials Research and Engineering, Agency for Science, Technology, and Research (A*STAR), 2 Fusionopolis Way, #08-03, Innovis, Singapore, Singapore.

Advanced Materials (Deerfield Beach, Fla.)
|July 11, 2026
PubMed
Summary
This summary is machine-generated.

Researchers developed a high-numerical-aperture aluminum nitride metalens for deep-ultraviolet light. This breakthrough enables advanced nanofabrication and sub-micrometer imaging, overcoming limitations in optical component performance.

Keywords:
DUV metaopticsaluminum nitridedeep‐ultraviolet flat opticsdirect laser writing microscopyhigh numerical aperturelaser nanofabricationmetalensnanoscale imagingsub‐200 nm resolution

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Demonstration of a Hyperlens-integrated Microscope and Super-resolution Imaging
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Published on: September 8, 2017

Area of Science:

  • Optics and Photonics
  • Materials Science
  • Nanotechnology

Background:

  • Deep-ultraviolet (DUV) radiation is crucial for advanced nanofabrication and biomedical imaging.
  • The lack of compact, high-performance DUV optical components hinders technological progress.
  • Aluminum nitride (AlN) is a promising material for DUV optical applications.

Purpose of the Study:

  • To demonstrate a high-numerical-aperture (HNA) metalens operating in the DUV spectral range.
  • To establish a novel characterization method for HNA DUV metalenses.
  • To integrate HNA AlN metalenses into advanced imaging systems.

Main Methods:

  • Fabrication of an AlN metalens with a high numerical aperture (NA) of 0.9-0.7 at 266 nm.
  • Optical measurements to confirm diffraction-limited focusing.
  • Development of direct laser writing microscopy (DLWM) for characterization and nanofabrication.
  • Integration of the metalens into a confocal photoluminescence imaging system.

Main Results:

  • Achieved record-high numerical aperture (NA=0.9-0.7) for a DUV metalens at 266 nm.
  • Demonstrated diffraction-limited focusing performance.
  • Utilized DLWM for 100 nm critical dimension nanofabrication and universal HNA DUV metalens characterization.
  • Enabled sub-micrometer spectroscopic imaging and resolved 300 nm features using the metalens in a confocal photoluminescence system.

Conclusions:

  • AlN metalenses offer a transformative platform for high-resolution DUV applications.
  • The developed DLWM provides a universal characterization technique for HNA DUV metalenses.
  • HNA AlN metalenses enable compact and high-performance DUV spectroscopic imaging systems.