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A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks
Published on: April 28, 2023
High Numerical Aperture Metalens for the Deep Ultraviolet
Omar A M Abdelraouf1, Chee Leng Lay1, Haoyu Ge1
1Institute of Materials Research and Engineering, Agency for Science, Technology, and Research (A*STAR), 2 Fusionopolis Way, #08-03, Innovis, Singapore, Singapore.
Researchers developed a high-numerical-aperture aluminum nitride metalens for deep-ultraviolet light. This breakthrough enables advanced nanofabrication and sub-micrometer imaging, overcoming limitations in optical component performance.
Area of Science:
- Optics and Photonics
- Materials Science
- Nanotechnology
Background:
- Deep-ultraviolet (DUV) radiation is crucial for advanced nanofabrication and biomedical imaging.
- The lack of compact, high-performance DUV optical components hinders technological progress.
- Aluminum nitride (AlN) is a promising material for DUV optical applications.
Purpose of the Study:
- To demonstrate a high-numerical-aperture (HNA) metalens operating in the DUV spectral range.
- To establish a novel characterization method for HNA DUV metalenses.
- To integrate HNA AlN metalenses into advanced imaging systems.
Main Methods:
- Fabrication of an AlN metalens with a high numerical aperture (NA) of 0.9-0.7 at 266 nm.
- Optical measurements to confirm diffraction-limited focusing.
- Development of direct laser writing microscopy (DLWM) for characterization and nanofabrication.
- Integration of the metalens into a confocal photoluminescence imaging system.
Main Results:
- Achieved record-high numerical aperture (NA=0.9-0.7) for a DUV metalens at 266 nm.
- Demonstrated diffraction-limited focusing performance.
- Utilized DLWM for 100 nm critical dimension nanofabrication and universal HNA DUV metalens characterization.
- Enabled sub-micrometer spectroscopic imaging and resolved 300 nm features using the metalens in a confocal photoluminescence system.
Conclusions:
- AlN metalenses offer a transformative platform for high-resolution DUV applications.
- The developed DLWM provides a universal characterization technique for HNA DUV metalenses.
- HNA AlN metalenses enable compact and high-performance DUV spectroscopic imaging systems.
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