Related Experiment Video
Updated: Jul 14, 2026

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
Published on: March 22, 2024
High-Temperature and High-Speed Atomic Force Microscopy Using a qPlus Sensor in Liquid via Quadpod Scanner and
Yuto Nishiwaki1, Toru Utsunomiya1, Takashi Ichii1
1Department of Materials Science and Engineering, Kyoto University, Sakyo, Kyoto, Japan.
High-temperature atomic force microscopy (AFM) now achieves atomic resolution on molten metal interfaces above 200°C. This breakthrough enables new insights into liquid-metal/solid interactions for applications like soldering and catalysis.
Area of Science:
- Materials Science
- Surface Science
- Nanotechnology
Background:
- Studying liquid-solid interfaces at the atomic level is crucial for understanding phenomena like corrosion, catalysis, and phase transitions.
- Traditional atomic force microscopy (AFM) techniques are limited in their ability to image these interfaces at elevated temperatures due to thermal drift and sensor limitations.
Purpose of the Study:
- To develop and demonstrate a high-temperature, high-speed AFM system capable of atomic-resolution imaging of molten metal/solid interfaces above 200°C.
- To investigate the surface structure of molten Gallium (Ga) on a solid PtGax substrate at elevated temperatures.
Main Methods:
- Development of a high-speed Quadpod scanner designed for tip-scanning and accommodating a high-mass qPlus sensor (2.3 g) to improve thermal drift tolerance.
- Implementation of a Hybrid-Loop frequency demodulation technique for low-resonant-frequency sensors, offering a wider bandwidth compared to conventional phase-locked loops.
- Utilizing a high-temperature, high-speed AFM system equipped with a qPlus sensor to image the molten Ga/PtGax interface at approximately 210°C.
Main Results:
- Achieved atomic-resolution imaging of the molten Ga/PtGax interface at ~210°C.
- Observed a low-symmetry surface with an oblique lattice and superstructure at 210°C, contrasting with the primitive rectangular lattice seen in the room-temperature sample.
- Demonstrated the capability of the developed AFM technique to visualize non-aqueous liquid/solid interfaces above 200°C at atomic resolution.
Conclusions:
- The developed high-temperature, high-speed AFM technique successfully enables atomic-resolution imaging of molten metal/solid interfaces above 200°C.
- The observed structural changes at the molten interface highlight the dynamic nature of liquid-solid interactions at high temperatures.
- This advancement opens possibilities for in-situ studies of processes like injection molding, soldering, and the development of liquid-metal catalysts.
More Related Videos
05:04Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
14:13Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Related Concept Videos
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Mass Analyzers: Common Types
Overview of Microscopy Techniques