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Research on Signal Denoising of Pumped-Storage Units Based on Parameter-Adaptive VMD and Wavelet Thresholding
Tianmin Li1, Yuechao Wu2, Fengque Pei1
1College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213200, China.
Sensors (Basel, Switzerland)
|July 15, 2026
Summary
This study introduces a novel joint signal denoising method for pumped-storage units, combining adaptive Variational Mode Decomposition (VMD) and wavelet thresholding. The technique effectively reduces noise, enhancing data reliability for unit analysis.
Area of Science:
- Engineering
- Signal Processing
- Mechanical Vibrations
Background:
- Vibration signals in pumped-storage units exhibit non-stationary and non-linear characteristics.
- These signals are often corrupted by strong background noise, hindering accurate analysis.
- Existing denoising methods may not adequately address these complex signal properties.
Purpose of the Study:
- To propose a robust joint signal denoising method for vibration signals from pumped-storage units.
- To enhance the signal-to-noise ratio (SNR) and reduce errors in collected data.
- To provide a reliable foundation for subsequent unit research and analysis.
Main Methods:
- Parameter-adaptive Variational Mode Decomposition (VMD) optimized using Improved Particle Swarm Optimization (IPSO).
- Cross-correlation analysis for screening decomposed signal components.
- Secondary denoising using wavelet thresholding on selected components.
Main Results:
- The proposed method effectively eliminates noise from complex vibration signals.
- Significant improvements in signal-to-noise ratio (SNR) were observed.
- A notable reduction in root mean square error (RMSE) was achieved compared to other methods.
Conclusions:
- The joint VMD and wavelet thresholding method offers superior denoising performance for pumped-storage unit vibrations.
- This approach provides a reliable data foundation for engineering applications.
- The study highlights substantial practical engineering significance for condition monitoring and fault diagnosis.