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Training-Free Defect Image Generation with Multi-Domain Consistency and Geometric-Semantic Constraints for Industrial
Yushen Wang1, Dengbiao Jiang1, Yiming Wang2
1School of Computer, Jiangsu University of Science and Technology, Zhenjiang 212003, China.
Abstract:
Industrial defect generation has long been challenged by the scarcity of real anomaly samples and the imbalance of defect categories, particularly in complex industrial scenarios involving transparent containers. Taking vials as an example, glass reflection, specular highlights, and fine-grained defects make continuous defect acquisition difficult, thereby making the realism and controllability of augmented samples critical to downstream detection performance. Although existing diffusion-based generation methods can improve synthetic image quality, they often require additional training or lightweight fine-tuning, which limits their efficiency in sample-limited industrial scenarios. To address this issue, this paper builds upon the TF-IDG framework and proposes a training-free industrial defect generation method based on multi-domain consistency and geometric-semantic constraints. To alleviate the unnatural texture details, boundary transitions, and background blending commonly observed in generated defects, a multi-domain consistency constraint is introduced to enhance generation realism from both frequency-domain structures and cross-domain contextual representations, thereby improving anomaly texture expression and overall visual coherence. To further mitigate unstable defect contours, spatial deviation, and structural mismatch with target objects, a geometric-semantic constraint is designed to regulate the generation process through elastic shape constraints and semantic region-anchored attention, enhancing the rationality of defect morphology evolution and spatial localization. Experimental results on both the MVTec AD dataset and a self-built vial defect dataset demonstrate that the proposed method outperforms comparative approaches. Specifically, when YOLOv11 is used as the downstream detector, the mAP@50 on the MVTec AD dataset and the self-built vial defect dataset is improved from 88.5% and 98.0% for the TF-IDG baseline to 89.6% and 98.8%, respectively.
