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Supervised artificial intelligence classification of clinker processing conditions by optical microscopy
Daniela Gastaldi1, Mirko Ippolito1, Fulvio Canonico1
1Built-Buzzi Innovation Lab and Technology, Vercelli, Italy.
Journal of Microscopy
|July 17, 2026
Summary
This study explores using artificial intelligence (AI) to analyze industrial clinker micrographs, aiming to automate sample interpretation and reduce subjectivity in optical microscopy. AI shows promise in supporting operators and autonomously determining experimental parameters.
Area of Science:
- Materials Science
- Computer Science
- Industrial Chemistry
Background:
- Optical microscopy is crucial for characterizing industrial clinkers, providing insights into production processes.
- Current limitations include time-consuming sample preparation, image interpretation, and operator subjectivity.
- Automating clinker analysis is of significant interest to enhance efficiency and objectivity.
Purpose of the Study:
- To investigate the application of supervised artificial intelligence (AI) methodologies to clinker micrographs.
- To assess AI's capability to support human operators in interpreting experimental results.
- To evaluate AI's potential for autonomously determining experimental parameters in clinker analysis.
Main Methods:
- Utilized supervised artificial intelligence (AI) models.
- Applied AI to a dataset of clinker micrographs.
- Focused on AI's ability to interpret images and determine experimental parameters.
Main Results:
- AI models demonstrated a promising capability in analyzing clinker micrographs.
- The study confirmed AI's potential to support human operators in result interpretation.
- AI showed effectiveness in autonomously determining experimental parameters.
Conclusions:
- Supervised AI methodologies show significant potential for automating industrial clinker analysis.
- AI can enhance the objectivity and efficiency of optical microscopy in clinker characterization.
- Further development of AI in this field could revolutionize industrial process monitoring.
