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Updated: Aug 6, 2026
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Published on: November 21, 2019
Imaging the Transverse Component of Optical Near-Fields in Resonant Photonic Structures
Petr Koutenský1, Neli Laštovičková Streshkova1, Stefanie Kraus2
1Department of Chemical Physics and Optics, Faculty of Mathematics and Physics, Charles University, Ke Karlovu 3, Prague 2 CZ-12116, Czech Republic.
ACS Photonics
|July 23, 2026
Summary
Ultrafast 4D scanning transmission electron microscopy (U4DSTEM) visualizes optical near-fields in photonic structures. This technique reveals transverse electron streaking capabilities for electron acceleration applications.
Area of Science:
- Photonics
- Electron Microscopy
- Nanotechnology
Background:
- Optical near-fields in photonic structures are crucial for light-matter interactions.
- Understanding these fields at high resolution is key for advanced applications like electron acceleration.
Purpose of the Study:
- To image optical near-fields in resonant periodic photonic structures with nanometer resolution.
- To visualize the Lorentz force component and near-field mode intensity for electron acceleration.
Main Methods:
- Utilizing ultrafast 4D scanning transmission electron microscopy (U4DSTEM).
- Applying U4DSTEM to a periodic silicon nanostructure excited by infrared femtosecond pulses.
- Employing finite-difference time-domain (FDTD) simulations for comparison.
Main Results:
- Successfully imaged optical near-fields with nanometer resolution.
- Visualized the transverse Lorentz force component of a synchronous near-field mode.
- Demonstrated transverse electron streaking at optical frequencies using polarized light.
- Validated spatial near-field intensity profiles against FDTD simulations.
Conclusions:
- U4DSTEM provides unprecedented resolution for imaging optical near-fields.
- Periodic photonic structures enable efficient transverse electron streaking for acceleration.
- The findings support the design of nanostructures for photonic control of electrons.
