Imaging the Transverse Component of Optical Near-Fields in Resonant Photonic Structures

We report on imaging the optical near-fields in resonant periodic photonic structures with nanometer resolution using ultrafast 4D scanning transmission electron microscopy (U4DSTEM). In particular, U4DSTEM is applied to visualize the transverse component of the Lorentz force of a synchronous near-field mode excited by an infrared femtosecond pulse in a periodic silicon nanostructure designed for the photonic acceleration of electrons. Our results show that in addition to the accelerating/decelerating force acting on the electrons in the longitudinal direction along the electron propagation, the structures can be efficiently used for transverse electron streaking at optical frequencies when excited by light with polarization perpendicular to the electron trajectory. The measured spatial profile of the excited near-field mode intensity is consistent with the numerical simulations performed using the finite-difference time-domain technique.