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Supersampled Scanning Transmission X-Ray Microscopy for High-Resolution Vibration-Independent Time-Resolved Imaging
Simone Finizio1, Benjamin Watts1, Benedikt Rösner1
1Paul Scherrer Institut, Villigen PSI, Switzerland.
Small (Weinheim an Der Bergstrasse, Germany)
|July 26, 2026
Summary
Supersampled scanning microscopy enhances nanoscale imaging by reducing overhead and eliminating vibration noise. This new method improves the precision of scanning transmission x-ray microscopy (STXM) for detailed material analysis.
Area of Science:
- Nanotechnology
- Materials Science
- Microscopy
Background:
- Scanning transmission x-ray microscopy (STXM) offers nanoscale chemical and physical property mapping.
- High-resolution STXM is limited by sample positioning precision and vibration.
- Current methods incur significant overhead, especially at low pixel dwell times.
Purpose of the Study:
- To introduce supersampled scanning microscopy for improved STXM.
- To reduce overhead times in high-resolution STXM.
- To mitigate the impact of vibrational noise on imaging quality.
Main Methods:
- Developed supersampled scanning microscopy technique.
- Sample positions are sampled at rates exceeding the vibration spectrum.
- Reconstructed sample transmission images from position and detector count data.
Main Results:
- Demonstrated significant reduction in overhead times.
- Successfully removed effects of vibrational noise.
- Achieved proof-of-concept high-resolution imaging experiments.
Conclusions:
- Supersampled scanning microscopy enhances STXM performance.
- The technique offers a viable solution for precise nanoscale imaging.
- Enables more efficient and robust material property mapping.
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