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Updated: Aug 5, 2026
10:04
Sample Drift Correction Following 4D Confocal Time-lapse Imaging
Published on: April 12, 2014
A real-time correction method for sample drift in STXM based on Fourier transform image registration
Yuchen Jiao1,2,3, Zijian Xu3,1,4, Tianxiao Sun4
1University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
Journal of Synchrotron Radiation
|July 28, 2026
Summary
This study introduces an online drift correction method for Scanning Transmission X-ray Microscopy (STXM) stack scans. The technique significantly reduces sample drift, improving experimental efficiency and data quality in nanoscale chemical analysis.
Area of Science:
- * Materials Science and Nanotechnology
- * Synchrotron Radiation Physics
- * Analytical Chemistry
Background:
- * Scanning Transmission X-ray Microscopy (STXM) utilizes Fresnel zone plates (FZPs) for high-resolution nanoscale imaging.
- * STXM's stack scan mode enables nanoscale chemical analysis by combining energy scanning with imaging.
- * Sample drift during STXM stack scans, caused by thermal effects and misalignment, increases scan area and time.
Purpose of the Study:
- * To develop and implement an online method for correcting sample drift during STXM stack scans.
- * To reduce the impact of thermal drift and beam path misalignment on imaging accuracy.
- * To enhance the efficiency and reliability of STXM-based nanoscale chemical analysis.
Main Methods:
- * Implementation of an online drift correction algorithm for STXM stack scans.
- * Integration of a Fourier transform image registration algorithm with laser interferometer position data.
- * Real-time monitoring and adjustment of sample position during the scanning process.
Main Results:
- * The proposed method effectively reduced sample drift in a 100-image STXM stack scan from over 1 µm to under 120 nm.
- * Significant reduction in redundant scanning area was achieved.
- * Experimental efficiency for STXM stack scans was substantially improved.
Conclusions:
- * The online drift correction method successfully eliminates sample drift in STXM stack scans.
- * This technique enhances the precision and speed of nanoscale chemical analysis using STXM.
- * The improved methodology contributes to more efficient synchrotron radiation experiments.
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