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Updated: Aug 5, 2026

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Sample Drift Correction Following 4D Confocal Time-lapse Imaging
Published on: April 12, 2014
A real-time correction method for sample drift in STXM based on Fourier transform image registration
Yuchen Jiao1,2,3, Zijian Xu3,1,4, Tianxiao Sun4
1University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
Journal of Synchrotron Radiation
|July 28, 2026
Summary
This study introduces an online drift correction method for Scanning Transmission X-ray Microscopy (STXM) stack scans. The technique significantly reduces sample drift, improving experimental efficiency and data quality.
Area of Science:
- Synchrotron Radiation Science
- Nanoscale Imaging Techniques
- Materials Analysis
Background:
- Scanning Transmission X-ray Microscopy (STXM) utilizes Fresnel zone plates (FZPs) for high-resolution nanoscale imaging.
- STXM's stack scan mode enables nanoscale chemical analysis by energy scanning across X-ray absorption edges.
- Sample drift during STXM stack scans, caused by thermal drift and misalignment, increases scan area and time.
Purpose of the Study:
- To develop and implement an online drift correction method for STXM stack scans.
- To mitigate sample drift issues that degrade imaging quality and experimental efficiency.
- To enhance the reliability and speed of nanoscale chemical analysis using STXM.
Main Methods:
- A novel method combining Fourier transform image registration with laser interferometer position information was developed.
- This approach enables real-time correction of sample position during STXM stack scans.
- The method was tested on a 100-image stack scan experiment.
Main Results:
- The proposed method effectively reduced sample drift from over 1 µm to less than 120 nm.
- Continuous sample drift during stack scanning was significantly eliminated.
- Redundant scan areas were greatly reduced, leading to improved experimental efficiency.
Conclusions:
- The developed online drift correction method is highly effective in eliminating sample drift in STXM stack scans.
- This technique substantially enhances experimental efficiency and data reliability for nanoscale chemical analysis.
- The method offers a significant advancement for synchrotron radiation-based nanoscale imaging and analysis.
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