A real-time correction method for sample drift in STXM based on Fourier transform image registration

Yuchen Jiao1,2,3, Zijian Xu3,1,4, Tianxiao Sun4

  • 1University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China.

Summary

This study introduces an online drift correction method for Scanning Transmission X-ray Microscopy (STXM) stack scans. The technique significantly reduces sample drift, improving experimental efficiency and data quality.

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