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Leveraging root trait identification for winter wheat yield prediction using machine learning

Fei Zhao1, Farhan Bin Mohamed1, Guofang Wang2

  • 1Faculty of Computing, Universiti Teknologi Malaysia, Johor Bahru, Johor, Malaysia.

Summary

Accurate winter wheat yield prediction requires understanding root traits across soil depths. Root dry matter density in the 20-30 cm layer proved most predictive, improving models and offering insights into yield variation.