Oxygen-vacancy-related defects and interfacial electron transfer in SnO2/WO3 heterojunctions for enhanced NO2

Chuan Luo1, Bingqin Lv2, Cheng Xu2

  • 1Faculty of Information Engineering and Automation, Kunming University of Science and Technology, Kunming 650500, China; Yunnan Key Laboratory of Computer Technology Applications, Kunming 650500, China.

Talanta
|August 1, 2026
PubMed

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