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Simple FT-IR determination of electron richness in metal-supported faujasites
Alejandro Serrano-Maldonado1, Belén Lerma-Berlanga1, Yongkun Zheng1
1Instituto de Tecnología Química (Consejo Superior de Investigaciones Científicas-Universitat Politècnica de València), 46022 València, Spain. anleyva@itq.upv.es.
Abstract:
We show a simple way to compare the electronic properties of a zeolite framework by a standard FT-IR analysis, after following the shift of the peak at ∼600 cm-1, which corresponds to the Si-O-Si bond bending [double ring (DR6)] vibrations of the framework. The FT-IR peak can significantly redshift from one metal-supported zeolite to another depending on the reduction degree of the metal. These results bring an extremely fast, inexpensive and non-destructive method to assess the electron density in metal-supported zeolites.
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