Ion Diffusion-Induced Multi-Interface Reconstruction for High-Resolution Perovskite X-Ray Flat-Panel Detectors

Area of Science:

• Materials Science
• Medical Imaging Physics
• Solid-State Electronics

Background:

• State-of-the-art perovskite X-ray flat-panel detectors (FPDs) suffer from limited spatial resolution due to poorly integrated interfaces.
• Improving interface integration is crucial for advancing perovskite FPD performance.

Purpose of the Study:

• To develop high-resolution perovskite FPDs with enhanced spatial resolution and sensitivity.
• To address the challenge of limited spatial resolution in perovskite FPDs through interface engineering.

Main Methods:

• Interface reconstruction strategy tailored for perovskites.
• Utilizing Fick's law-guided ion diffusion in thick perovskite layers.
• Fabrication of large-area (8.5 × 8.5 cm²) polycrystalline perovskite FPDs.

Main Results:

• Achieved a record modulation transfer function (MTF) of 6.2 line pairs per millimeter (lp mm⁻¹).
• Demonstrated ultrasensitive X-ray detection with a sensitivity-to-dark current ratio of 2.61 × 10¹¹ µC Gyair⁻¹ A⁻¹.
• Exhibited excellent stability over 5760 hours and high detective quantum efficiency (76.9%).

Conclusions:

• The interface reconstruction strategy significantly improves spatial resolution and sensitivity in perovskite FPDs.
• The developed FPDs enable high-resolution X-ray imaging at low radiation doses.
• This advancement paves the way for commercial applications in digital radiography and industrial inspection.