Dynamic twisting and imaging of moiré crystals

Moiré superlattices in stacked two-dimensional crystals are powerful platforms for engineering correlated and topological quantum phases, with twisted graphene and transition metal dichalcogenides as prominent examples. Their angle-sensitive band structures enable rich tunability; however, conventional tear-and-stack methods fix the angle at assembly, limiting systematic exploration of angle-dependent phenomena. Here, we present a scanning probe-based manipulation scheme that enables in situ, continuous postfabrication twist control using nanostructured metal rotors. We demonstrate reproducible angle tuning and direct moiré imaging across three platforms: graphene, hexagonal boron nitride, and encapsulated, air-sensitive MoTe₂. Quantitative piezoresponse force microscopy analysis confirms subdegree precision with minimal induced heterostrain, preserving sample quality even in the marginally twisted regime. Crucially, the device architecture maintains open access to the active region, allowing optical, scanning probe, and transport measurements. This work enables single-device mapping of the angular phase diagram of moiré material including the minimally twisted regime.