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Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
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Polarization-resolved dual-mode near-field terahertz single-pixel imaging
Optics Express
|August 14, 2026
Summary
We developed a new terahertz single-pixel imaging method for polarization-insensitive imaging. This technique enhances image quality and resolution for microscale structures.
Area of Science:
- Optics and Photonics
- Materials Science
- Imaging Technology
Background:
- Conventional terahertz near-field imaging suffers from polarization-dependent resolution anisotropy.
- This limitation hinders high-fidelity imaging of microscale structures.
Purpose of the Study:
- To develop a polarization-resolved dual-mode near-field terahertz single-pixel imaging (THz-SPI) scheme.
- To achieve polarization-insensitive and isotropic sub-wavelength imaging.
Main Methods:
- Utilized a [110]-cut ZnTe crystal for synchronous acquisition of orthogonally polarized THz near-field images.
- Developed a fusion model integrating signal-to-noise ratio (SNR) and total variation (TV) criteria with an optimized weight coefficient (r=0.52).
Main Results:
- Achieved a fused image with an SNR of 22.97, demonstrating a ~1.5-fold enhancement over single-polarization images.
- Successfully eliminated resolution anisotropy, enabling high-fidelity polarization-resolved imaging.
- Demonstrated isotropic sub-wavelength imaging capabilities.
Conclusions:
- The proposed THz-SPI scheme provides a robust framework for polarization-resolved detection.
- This advancement broadens the applicability of near-field THz-SPI for versatile terahertz metrology and imaging of microscale structures.

