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Updated: Sep 16, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Dual X-Ray and Optical System for In Situ Monitoring of Solids Fraction in Tailings
Talwinder Kaur Sraw1, Bo Yu1, Xiaoxuan Liu1
1Department of Electrical and Computer Engineering, University of Alberta, 9211 116 Street NW, Edmonton, AB T6G 1H9, Canada.
Abstract:
A sensing apparatus was developed to quantify solids fraction within a 3 m test column, demonstrating real-time monitoring of tailings sedimentation. This integrated system employs a low-power infrared laser coupled with scattering detectors alongside a low-activity radioactive source and detector. Both methodologies utilize non-destructive principles to evaluate the concentration of solids. Specifically, X-ray transmission through the medium provides a measure of the solids fraction, as X-ray attenuation corresponds to the solids percentage. Concurrently, the optical component detects radiation backscatter from the sample. To ensure precision, both instruments underwent calibration using reference materials. Experimental evaluations were conducted using two configurations: a fixed array and a depth-profiling setup. The former utilized a 2.5 m plastic column with integrated sensors placed within a settling vessel to acquire data at discrete depths. Conversely, the depth-profiling configuration involved a submersible mobile unit lowered into the column to characterize the solids profile at arbitrary depths.
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