Related Experiment Video
Updated: Sep 23, 2026

Slice Patch Clamp Technique for Analyzing Learning-Induced Plasticity
Published on: November 11, 2017
Memory-induced active particle ratchets: Mean currents and large deviations
Venkata D Pamulaparthy1, Rosemary J Harris1
1University College London, Department of Mathematics, , Gower Street, London WC1E 6BT, United Kingdom.
Abstract:
We analyze a continuous-time random walk model with stochastic reversals of direction. There is no external potential but the reorientation mechanism generates a nonzero current from asymmetry in the forward and backward waiting-time distributions (even when they have the same mean); the system can therefore be considered as a type of active particle ratchet. We derive an explicit expression for the mean ratchet current with exponentially distributed reorientation times and also develop a general renewal-theory framework to obtain the full large deviations, using this to comment on the possibility of dynamical phase transitions.
Related Concept Videos
Atomic Nuclei: Nuclear Relaxation Processes
Potential Due to a Magnetized Object
The vector...
Motional Emf
Atomic Nuclei: Magnetic Resonance
Patch Clamp
In this method, a glass micropipette containing electrolyte solution is tightly sealed against a small portion of the cell membrane. As a result, a patch of the cell...
Torque On A Current Loop In A Magnetic Field
Consider a rectangular current-carrying loop containing N turns of wire, placed in a uniform magnetic field. The net force on a current-carrying loop...

