Scan-level acquisition dependence and validation bias in batch near-infrared hyperspectral imaging: a two-instrument

Xindong Wang1, Zhiqi Liu1, Jianxin Xue1

  • 1College of Agricultural Engineering, Shanxi Agricultural University, No. 1 Mingxian Road, Taigu, Jinzhong, Shanxi 030801, China; Key Laboratory of Agricultural Machinery Technology and Equipment of Shanxi Province, Jinzhong City, China.