Atomic Defect-Mediated Charge Trapping Enables Multimodal Plasticity in van der Waals Heterostructures for In-Sensor

Jinyong Wang1, Geyang Wang2, Yun Ji1

  • 1Department of Electrical and Computer Engineering, National University of Singapore, Singapore117576, Singapore.

Nano Letters
|October 22, 2026
PubMed