Initial Performance Evaluation of an Ultraviolet 157 nm Laser Ablation System for ICP-MS Analysis

Laser wavelength largely governs analytical accuracy in laser ablation microanalysis. Most routine laser ablation systems rely on 193 nm excimer lasers, while the considerably shorter 157 nm wavelength has only been applied sparingly to in situ microanalysis. This study presents a 157 nm F2 laser system with an optical path purged and protected by an inert gas (N2) and provides a comprehensive performance evaluation of its integration with LA-(MC-) ICP-MS. The 157 nm laser effectively ablates transparent minerals such as quartz and fluorite, producing flat-bottomed craters free of fracturing. Systematic evaluations of trace elements, zircon U-Pb dating, and in situ Hf-B isotopic analyses consistently demonstrate robust analytical performance of the 157 nm laser across diverse in situ microanalysis applications. These capabilities position the 157 nm laser to enhance spatial resolution in highly transparent minerals, facilitating the acquisition of finer-scale chemical insights for a broad range of Earth science and environmental investigations.