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Updated: Oct 25, 2026

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Native Defects Enable Facile Measurement of the Carrier Concentration in Two-Dimensional Semiconductors Using Kelvin

Kenneth Ortiz Chua1, Devon P Leimkuhl1, Pablo Fernandez1

  • 1Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina27599, United States.

Nano Letters
|October 23, 2026
PubMed

Keywords:
Kelvin probe force microscopycarrier concentrationsemiconductorstransition-metal dichalcogenide

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