3-dimensional localization using X-ray lightsheet microscopy with non-blinking scintillating nanoparticles

We present two key achievements along the path towards widespread applications of nanometer-accuracy X-ray lightsheet microscopy. First, the thin volume of the X-ray lightsheet excitation eliminated the need for blinking scintillating nanoparticles (SciNPs) or fluorophores - typically required for super-resolution localization. This notably increased the reliability in localization analysis on the distribution of densely populated SciNPs on the surface of a silica microsphere. Second, we specifically achieved nanometer-level position accuracy in both axial (2 nm) and lateral (7 nm) coordinates using a three-dimensional localization method.