Computational insights into defect induced modulation in electronic properties of 2D nitride monolayers
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Updated: Nov 5, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Shreya G Sarkar1, Kuneh Parag Shah2, Brahmananda Chakraborty3,4
1Accelerator & Pulsed Power Division, Bhabha Atomic Research Centre, Mumbai 400085, India.
Abstract:
Two-dimensional (2D) nitride materials such as hexagonal boron nitride (h-BN), graphitic carbon nitride (g-C3N4), and beryllonitrene (BeN4) have emerged as promising candidates for next-generation electronic, optoelectronic, and energy applications due to their unique structural and electronic properties. This study presents a systematic investigation of the effects of vacancy defects, specifically the role of nitrogen and constituent atom vacancies, on the electronic properties of these materials. Our findings reveal that the introduction of nitrogen vacancies significantly alters the electronic characteristics of these materials. In h-BN, the presence of a nitrogen monovacancy significantly lowers the work function from 5.97 eV to 3.45 eV. Additionally, this defect reduces the band gap from 4.6 eV to 0.64 eV, driving the material toward half-metallic behaviour. This is accompanied by the emergence of flat bands near the Fermi level, indicative of strong electron-electron interactions. In g-C3N4, nitrogen vacancies lead to a decrease in work function and band gap, with double nitrogen vacancies rendering the material nearly metallic. In BeN4, nitrogen vacancies result in minimal charge redistribution and a slight increase in work function, highlighting the material's unique electronic behaviour. These results underscore the potential of vacancy engineering in tuning the electronic properties of 2D nitride materials, offering avenues for the design of materials with tailored work functions and band gaps for applications in optoelectronics, spintronics, and catalysis.
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