A wide-energy range multi-crystal x-ray emission spectrometer in the laboratory
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Updated: Nov 7, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Can Yu1,2, Mengqin Tao1, Feng Nie1
1Anhui Absorption Spectroscopy Analysis Instrument Co., Ltd., Hefei, People's Republic of China.
Abstract:
We report on the design and performance of a wide-energy range, multi-crystal von Hamos-type spectrometer for x-ray emission spectroscopy (XES) in the laboratory. The instrument covers an energy range of 1.4-9 keV, encompassing emission lines from aluminum to actinide elements, thereby facilitating investigations of a broad range of complex reaction systems. An energy resolution of 0.9 eV is achieved at the S Kα emission line, enabling the detection of fine electronic structure details. By employing a 3 × 3 array of crystal analyzers, the solid angle per unit energy is increased to 0.87 msr/eV. Further coupling with a high-power x-ray source, the spectrometer provides a foundation for time-resolved XES measurements. The entire spectrometer is integrated into a glovebox and operates under an atmospheric helium atmosphere, allowing for in situ monitoring of reactions under diverse conditions. The development and deployment of this instrument provide a powerful tool for rapid material screening and tracking of dynamic electronic structure evolution.
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