Understanding enhanced valley polarization in stacked MoS2 bilayers with zero twist angle
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Updated: Nov 10, 2026

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Zhanjie Qiu1, Yizhengyang Zhan1, Yue Chen1
1School of Physics, Zhejiang Key Laboratory of Micro-Nano Quantum Chips and Quantum Control, Zhejiang University, Hangzhou 310027, P. R. China. yewuwang@zju.edu.cn.
Abstract:
Improving the degree of valley polarization (DVP) in transition metal dichalcogenides (TMDs) is crucial for exploiting the valley degree of freedom in valleytronic applications. While extensive efforts have focused on enhancing DVP in TMD monolayers, investigations of this property in bilayer and multilayer systems remain limited. Here, MoS2 bilayers were fabricated by stacking two monolayers in a parallel alignment (0° twist angle), and a pronounced enhancement in DVP was observed compared with that of MoS2 monolayers. Temperature-dependent spectroscopy demonstrates that this enhancement arises from two cooperative mechanisms: preferential phonon-assisted carrier relaxation into the Λ valley, which suppresses intervalley scattering, and reduced electron-hole exchange in interlayer excitons, which lowers valley depolarization. These results identify stacking-controlled interlayer hybridization as a powerful route to engineer valley dynamics in layered semiconductors.
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