The "Barnum effect" and acceptance of negative personal evaluation

Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2011

Optical characterization of a four-medium thin film structure by real time spectroscopic ellipsometry: amorphous carbon on tantalum.

Applied optics·2010

Real-time characterization of film growth on transparent substrates by rotating-compensator multichannel ellipsometry.

Applied optics·2008

Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films.

Optics letters·2007

Multichannel mueller matrix ellipsometry for simultaneous real-time measurement of bulk isotropic and surface anisotropic complex dielectric functions of semiconductors.

Physical review letters·2003