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[Location resolving sound impulse transit time measurements].

H Newiger, K Giese, D Harder

    Ultraschall in Der Medizin (Stuttgart, Germany : 1980)
    |March 1, 1983
    PubMed
    Summary
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    This study presents a new method for measuring time of flight profiles in materials with millimeter spatial resolution and 10 nanosecond time resolution. Results show excellent agreement between theoretical models and experimental measurements for test objects.

    Area of Science:

    • Physics
    • Materials Science
    • Instrumentation

    Context:

    • Characterizing material properties requires precise measurement techniques.
    • Time-of-flight measurements are crucial for understanding dynamic processes.

    Purpose:

    • To demonstrate a novel method for recording transverse time-of-flight profiles.
    • To achieve high spatial and temporal resolution in measurements.

    Summary:

    • A new technique enables recording transverse time-of-flight profiles with millimeter spatial resolution and 10 nanosecond temporal resolution.
    • The method was validated using test objects, showing strong agreement between theoretical predictions and experimental data.

    Impact:

    • This method offers enhanced capabilities for material analysis and non-destructive testing.

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  • Improved resolution facilitates more accurate studies of material behavior and internal structures.