Proton-induced X-ray emission analysis - a new tool in quantitative dermatology

Proton-Induced X-ray Emission analysis (PIXE) constitutes a method for trace element analysis characterized by multielemental capability, detection limits in the low ppm-range and size resolution down towards a micrometre. In applications where the sensitivity of the Electron-Induced X-ray Emission (EIXE) analysis is not sufficient and where a spatial resolution not better than a few micrometres is required, the PIXE technique provides a powerful tool. In this paper properties of the PIXE method are demonstrated by quantitative results from three different samples of dermatological interest. Firstly, mercury results from a longitudinal scan of a single hair strand from a mercury poisoned person are shown. With a spatial resolution of one or a few millimetres very fast scans may be performed on hair strands giving information on time and magnitude of intoxication or other exposures, as well as deficiencies. Secondly, results are given from a radial scan with a beam width of 4 micron on hair from a person exposed to high amounts of iron. The calcium, iron and zinc distributions but not the sulphur and potassium distributions show narrow peaks of concentration (less than 4 micron) about 15 micron from the surface of the hair. Further investigations have to be performed in order to interpret these data. Thirdly, the depth profiles in skin of some elements were measured with a beam width of 10 micron. The results show significant increases in sulphur, calcium and zinc concentrations and significant decreases in phosphorous and potassium concentrations at the skin surface, i.e. in the stratum corneum.