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Deoxynivalenol in winter wheat: thin layer chromatographic method and survey
Journal - Association of Official Analytical Chemists
|January 1, 1984
Summary
A rapid method accurately detects deoxynivalenol (DON) in wheat, a mycotoxin from Fusaria. Most analyzed samples contained DON, with levels correlating to kernel damage, confirming its presence in contaminated crops.
Area of Science:
- Agricultural Chemistry
- Mycotoxicology
- Food Safety
Background:
- Fusaria contamination in winter wheat crops can lead to mycotoxin production.
- Deoxynivalenol (DON) is a significant mycotoxin affecting grain quality and safety.
- Accurate and rapid methods are needed for DON determination in agricultural commodities.
Purpose of the Study:
- To develop and validate a rapid analytical method for deoxynivalenol (DON) in wheat.
- To assess the prevalence and levels of DON in winter wheat from the Midwestern US.
- To investigate the relationship between DON contamination and kernel damage.
Main Methods:
- Sample extraction using an acetonitrile-water mixture (84:16).
- Column chromatography cleanup with charcoal-alumina.
- Determination by thin-layer chromatography (TLC) with AlCl3 visualization and confirmation by mass spectrometry.
Main Results:
- A rapid method achieved >80% recovery for DON added at 0.2 µg/g.
- DON was detected in 54 out of 57 wheat samples, averaging 3.6 µg/g (range 0.2–9.0 µg/g).
- DON levels generally correlated with the percentage of total damaged kernels.
Conclusions:
- The developed TLC method provides a rapid and effective means for DON quantification in wheat.
- Widespread DON contamination was confirmed in Midwestern winter wheat.
- Kernel damage serves as a potential indicator for DON contamination levels.