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Updated: Aug 11, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

Buildup of electronic equilibrium below the surface of an irradiated medium

K Unnikrishnan

    Strahlentherapie
    |April 1, 1980
    PubMed

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