Understanding the neostriatal microcircuitry: high-voltage electron microscopy

High voltage electron microscopy (HVEM) and HVEM tomography of selectively stained cell processes in the neostriatum have offered an alternative to serial thin section reconstruction for accurate 3-D visualization and measurement of axons, dendrites, and dendritic spines. Tissue preparation is simple and rapid, allowing examination of large numbers of specimens required for quantitation of neuronal morphology. The resolution of the images exceeds that available from any light microscopic technique and is appropriate for measurement of the finest axons and dendritic spine necks. HVEM tomography allows the direct measurement of dendritic surface area, required for computational modeling of synaptic integration.