A direct sensitivity matrix approach for fast reconstruction in electrical impedance tomography

In electrical impedance imaging, several proposed reconstruction algorithms have employed the concept of a sensitivity matrix, which can be used to relate the magnitude of a boundary voltage change of a 2D object to the change in conductivity inside the object that has given rise to it. The search for an appropriate inversion of the sensitivity matrix is the key to these algorithms. In this work, a method called the direct sensitivity matrix (DSM) approach for fast image reconstruction is proposed. Both theoretical and experimental results showing the efficiency of this proposed method are also presented.