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Metacarpophalangeal pattern profile analysis in Williams syndrome

M A Burns1, D R McLeod, L R Linton

  • 1University of Calgary Medical School, Alberta, Canada.

Summary

Williams syndrome (WS) diagnosis can be improved using metacarpophalangeal pattern profiles (MCPP). This study developed a mathematical model from MCPP data, achieving 91% accuracy in distinguishing WS patients from controls.

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