Capacitance studied of syntheric phospholipid Langmuir films

Synthetic phosphatidylcholine Langmuir films have been incorporated into metal-insulator-metal (MIM) thin film junctions. The capacitance characteristics of these junctions have been studied as a function of temperature, the number of lipid layers in the insulating layer, and the length of the hydrocarbon chains of the lipid molecule. The thickness of the oxide layer on the base aluminum electrode has been determined to be larger than or equal to 11 A, and its effects on the capacitance characteristics have been considered in some detail. Indications of phase transitions in the temperature dependence of the capacitance imply that the basic lemellar arrangement of the lipid molecules is retained even after the samples are subjected to a dehydrating vacuum annealing process. An examination of the effects of varying the hydrocarbon chain length and salt content of the subphase during sample fabrication showed that capacitance characteristics of the MIM junction are very sensitive to small structural changes in the insulating layer.