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Layer thickness in panoramic radiography as defined by different noise-equivalent passbands

M Shiojima1, A Bäckström, U Welander

  • 1Aichi-Gakuin University, Nagoya, Japan.

Summary

The layer thickness in rotational panoramic radiography is more accurately measured using two-dimensional data, including the vertical dimension. This approach provides a wider and more reliable assessment compared to traditional one-dimensional calculations.

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