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Related Experiment Videos

Environmental scanning electron microscope imaging examples related to particle analysis

S A Wight1, C J Zeissler

  • 1National Institute of Standards and Technology, Gaithersburg, Maryland 20899.

Microscopy Research and Technique
|August 1, 1993
PubMed
Summary
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Environmental scanning electron microscopy (ESEM) enables imaging of challenging, easily charged samples. This technique overcomes limitations of conventional SEM for particle analysis, including volatile and uncoated specimens.

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Environmental Science

Background:

  • Conventional scanning electron microscopy (SEM) faces challenges imaging uncoated, easily charged, or volatile samples.
  • Surface charging and vacuum incompatibility limit SEM analysis for many particle types.

Purpose of the Study:

  • To demonstrate the imaging capabilities of environmental scanning electron microscopy (ESEM) for difficult-to-image samples.
  • To showcase ESEM's application in particle analysis, overcoming conventional SEM limitations.

Main Methods:

  • Utilized environmental scanning electron microscopy (low vacuum or high pressure SEM).
  • Examined various uncoated and volatile samples, including fly ash, fibers, uranium oxide, and filter-collected particulate matter.
  • Applied ESEM to samples like polystyrene latex spheres and etched nuclear track-etch detectors.

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Main Results:

  • ESEM successfully imaged samples problematic for conventional SEM, such as oiled membranes and loosely mounted spheres.
  • Eliminated surface charging issues common in high vacuum SEM, enabling analysis of previously incompatible specimens.
  • Provided clear images of fly ash, fibers, uranium oxide, and particulate matter on filters.

Conclusions:

  • Environmental SEM significantly expands imaging possibilities for challenging particle analysis.
  • ESEM is a valuable tool for studying uncoated, volatile, and easily charged materials.
  • The technique overcomes key limitations of conventional SEM, offering broader applications in materials and environmental science.