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Evaluation of the implant-connection interface using scanning electron microscopy
G M Vidigal1, A B Novaes, O Chevitarese
1Faculdade de Odontologia, Universidade Grande Rio, Rio de Janeiro, Brasil.
Brazilian Dental Journal
|January 1, 1995
Abstract:
The objective of the present study was to evaluate the implant-connection interface using scanning electron microscopy for implants commercially available in Brazil, correlating these findings with the possible effects of a badly fitted interface on the clinical failure of the implant.