Added aluminum shielding to attenuate back scatter electrons from intra-oral lead shields

An intra-oral lead shield was developed that consists of a lead base with an aluminum layer that is placed upstream of the lead base. Several such shields with various thicknesses of Al layers were manufactured and quantitatively evaluated in 6 MeV and 12 MeV electron radiation by Thermoluminescent dosimetry (TLD) measurements. The clinical relevance was established by using a 5 cm backscatter block down-stream of the lead shield to simulate anatomical structures of the head and a 0.5 cm superflab bolus upstream of the Al layers of the shield to simulate the patient's lip or cheek. The TLDs were placed between the Al layers of the shield and the superflab to determine the intra-oral skin dose. TLD exposure results revealed that 59.8% of the skin dose at 6 MeV and 45.1% of the skin dose at 12 MeV is due to backscattered electrons. Introduction of a 3.0 mm thick Al layer reduces the backscatter contribution to 13.5% of the back scatter dose at 6 MeV and 56.3% of the back scatter dose at 12 MeV electron radiation.