Three-dimensional magnetic resonance microscopy of materials

Several aspects of magnetic resonance microscopy are examined employing three-dimensional (3D) back-projection reconstruction techniques in combination with either simple Bloch-decay methods or MREV-8 multiple-pulse line narrowing techniques in the presence of static field gradients. Applications to the areas of ceramic processing, catalyst porosity measurements and the characterization of polymeric materials are presented. The focus of the discussion centers on issues of sensitivity and resolution using this approach compared with other methods. Advantages and limitations of 3D microscopy over more commonly employed slice selection protocols are discussed, as well as potential remedies to some of the inherent limitations of the technique.