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Related Experiment Videos

[C-MOS flat-panel sensor for real time X-ray imaging]

K Nakagawa1, Y Aoki, Y Sasaki

  • 1Department of Radiology, University of Tokyo Hospital.

Nihon Igaku Hoshasen Gakkai Zasshi. Nippon Acta Radiologica
|April 29, 1998
PubMed
Summary
This summary is machine-generated.

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Researchers developed a novel solid-state X-ray imaging device using complementary metal-oxide-semiconductor (CMOS) arrays. This flat-panel detector achieves acceptable clinical image quality with high spatial resolution and low noise.

Area of Science:

  • Medical Imaging
  • Solid-State Physics
  • Semiconductor Devices

Context:

  • Advancements in diagnostic imaging are crucial for early disease detection.
  • Current X-ray detectors face limitations in resolution, noise, and fabrication scalability.
  • Solid-state detectors offer potential for improved performance and miniaturization.

Purpose:

  • To investigate and develop a flat-panel, self-scanning, solid-state diagnostic X-ray imaging device.
  • To evaluate the performance characteristics of a unit device with a 5 cm by 5 cm sensor area.
  • To explore methods for fabricating large-area sensors using the developed unit device.

Summary:

  • A unit device integrating a cesium iodide (CsI) scintillator with complementary metal-oxide-semiconductor (CMOS) detector arrays was fabricated and tested.

Related Experiment Videos

  • The detector features a 256x256 pixel arrangement, each comprising a CMOS photodiode sensor coupled to a CMOS field-effect transistor (FET).
  • Noise reduction techniques, including correlated double sampling and offset variance compensation, were implemented, achieving a sampling speed of 15 frames per second and a spatial resolution of 2.5 line pairs/mm.

    • Impact:

    • The developed CMOS-based X-ray imaging device demonstrates acceptable image quality for clinical applications.
    • Achieved performance metrics include a low noise level of 1.5 mV rms and a maximum signal of 1.8 V.
    • The study discusses the potential for fabricating large-area sensors, paving the way for advanced diagnostic imaging systems.