Fourier Transform Emission Spectroscopy of the A2Delta-X2Pi Transition of SiH and SiD

The emission spectra of the A2Delta-X2Pi transition of SiH and SiD have been observed at high resolution using a Fourier transform spectrometer. The molecules were excited in a Si hollow cathode lamp by passing a discharge through a mixture of Ne and a trace of H2 or D2. The present data, combined with the previous infrared vibration-rotation measurements, have been used to determine improved molecular constants for the ground and excited states of SiH and SiD. Copyright 1998 Academic Press.