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Updated: Jul 28, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
07:15

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

Published on: June 2, 2017

Imperfect oriented attachment: dislocation generation in defect-free nanocrystals

Penn1, Banfield

  • 1R. L. Penn, Materials Science Program, University of Wisconsin-Madison, Madison, WI 53706, USA. J. F. Banfield, Mineralogical Institute, Graduate School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113, Japan. E-m.

Science (New York, N.Y.)
|August 14, 1998
PubMed

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