Photon buildup in orthovoltage X-ray beams

Orthovoltage x-ray beams exhibit the characteristic of depth dose buildup which is not well described in the literature. The principal reason for this phenomenon is the increase in dose deposited due to electrons set in motion by secondary (Compton) scattered photons within the phantom, as depth is increased until longitudinal equilibrium is reached. This happens within a few millimetres of the surface and has been demonstrated both experimentally and by Monte Carlo methods. The Monte Carlo technique also enabled description of a second order primary dose buildup effect (due to longitudinal electronic disequilibrium) that would be impossible to detect with conventional detectors due to the short range of the electrons. The magnitude of buildup was observed to alter with various combinations of beam parameters. Variations will also occur with detectors used to measure buildup. It is recommended that radiation oncology departments assess this effect in the context of their clinical data in current use to ensure that there are not doses higher than prescribed being applied a few millimetres below the skin surface, especially if data was collected with a thin windowed, parallel plate ionisation chamber and/or that coarse steps for depth dose data collection were used along the beam central axis.