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Mammography spectrum measurement using an x-ray diffraction device

J M Boone1, T Yu, A Seibert

  • 1Department of Radiology, University of California, Davis, UC Davis Medical Center, Sacramento 95817, USA. jmboone@ucdavis.edu

Physics in Medicine and Biology
|October 2, 1998
PubMed
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This study presents an accurate method for measuring x-ray spectra using a specialized spectrometer, crucial for mammography quality assurance. The device provides reliable relative x-ray spectral data and attenuation coefficients for materials like aluminum.

Area of Science:

  • Medical Physics
  • X-ray Spectroscopy
  • Radiological Imaging

Background:

  • Accurate mammographic kV determination is essential for effective screening.
  • Existing methods for x-ray spectral measurement have limitations.
  • The Deslattes spectrometer offers potential for improved spectral analysis.

Purpose of the Study:

  • To adapt the Deslattes spectrometer for precise relative x-ray spectral measurements.
  • To evaluate the spectrometer's performance in the mammography energy range.
  • To assess the device's utility for determining material attenuation coefficients.

Main Methods:

  • Utilized a bent quartz diffraction crystal to diffract x-rays.
  • Employed an x-ray intensifying screen and charge-coupled device for detection.

Related Experiment Videos

  • Applied nonlinear correction procedures to energy and fluence axes of spectral data.

    • Main Results:

    • Achieved accurate relative x-ray spectral measurements between 12 keV and 40 keV.
    • Demonstrated excellent results for aluminum's energy-dependent mass attenuation coefficients (12-30 keV).
    • The spectrometer's low-energy cutoff is 12 keV due to its design.

    Conclusions:

    • The spectrometer is capable of precise relative x-ray spectral measurements for mammography.
    • The device shows promise for characterizing attenuation properties of breast tissues and phantoms.
    • This technology can enhance quality control and research in diagnostic radiology.